| 摘要 |
A material may be identified using THz radiation that simultaneously or sequentially includes at least one first frequency portion and a second frequency portion different therefrom. An object formed from the material to be identified is irradiated with the THz radiation and the THz radiation exiting the object is detected using a phase-sensitive THz receiver. A time or phase offset, caused by the object, is measured at least for the first frequency portion and a material thickness is determined therefrom. Attenuation of the received signal, at least for the second frequency portion, is determined. An absorption coefficient for at least the second frequency portion is calculated using the material thickness. |
