| 摘要 |
PURPOSE: A probe unit including a pressurizing member and a manufacturing method thereof are provided to improve electric test performance of an object by stably pressurizing an electrode unit of a driving IC. CONSTITUTION: A receiving groove is formed on the lower end of a probe block(421). A core(424) is combined with the receiving groove. A pressurizing member includes an elastic element(424a) formed in the end of the core. A driving IC is attached to the lower side of the probe block and includes an electrode unit. The pressurizing member is combined with the receiving groove using a coupling member.
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