发明名称 SIC SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A SiC semiconductor device and a manufacturing method thereof are provided to prevent the deviation of channel lengths by etching an impurity region and a mark region with the same mask while aligning the impurity region and the mark region. CONSTITUTION: In a SiC semiconductor device and a manufacturing method thereof, a SiC semiconductor layer(2) is formed on a substrate(1). A well region(3) is selectively formed in the surface of the SiC semiconductor layer. An impurity implantation region is selectively formed on the well region. A concave part is formed in the impurity implantation region excluding the surface end thereof. An area near the end region is a curved hook which is formed upwardly.</p>
申请公布号 KR20110093626(A) 申请公布日期 2011.08.18
申请号 KR20110007112 申请日期 2011.01.25
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 TSUCHIYA NORIAKI;TARUI YOICHIRO
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
代理机构 代理人
主权项
地址