发明名称 |
SIC SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<p>PURPOSE: A SiC semiconductor device and a manufacturing method thereof are provided to prevent the deviation of channel lengths by etching an impurity region and a mark region with the same mask while aligning the impurity region and the mark region. CONSTITUTION: In a SiC semiconductor device and a manufacturing method thereof, a SiC semiconductor layer(2) is formed on a substrate(1). A well region(3) is selectively formed in the surface of the SiC semiconductor layer. An impurity implantation region is selectively formed on the well region. A concave part is formed in the impurity implantation region excluding the surface end thereof. An area near the end region is a curved hook which is formed upwardly.</p> |
申请公布号 |
KR20110093626(A) |
申请公布日期 |
2011.08.18 |
申请号 |
KR20110007112 |
申请日期 |
2011.01.25 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION |
发明人 |
TSUCHIYA NORIAKI;TARUI YOICHIRO |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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