发明名称 Ultrashallow Emitter Formation Using ALD and High Temperature Short Time Annealing
摘要 An integrated circuit containing a bipolar transistor including an emitter diffused region with a peak doping density higher than 1·1020 atoms/cm3, and an emitter-base junction less than 40 nanometers deep in a base layer. A process of forming the bipolar transistor, which includes forming an emitter dopant atom layer between a base layer and an emitter layer, followed by a flash or laser anneal step to diffuse dopant atoms from the emitter dopant atom layer into the base layer.
申请公布号 US2011057289(A1) 申请公布日期 2011.03.10
申请号 US20100718142 申请日期 2010.03.05
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 WISE RICK L.;YASUDA HIROSHI
分类号 H01L29/73;H01L21/331 主分类号 H01L29/73
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