发明名称 ADAPTIVELY PLASMA SOURCE AND PLASMA CHAMBER FOR PROCESSING A LARGE-DIAMETER WAFER
摘要 PURPOSE: An adaptive plasma source and a plasma chamber for processing a large diameter wafer are provided to precisely control plasma density by using an ACP(Adaptively Coupled Plasma) source of the edge and a CCP(Capacitively Coupled Plasma) source function of the center. CONSTITUTION: A CCP top electrode(210) is arranged in the center. A conductive bushing(220) is arranged in order to surround the CCP top electrode. A source coil(230) is branched from the conductive bushing. The source coil is spirally arranged around the conductive bushing. The top RF source is connected to the CCP top electrode and the conductive bushing. The CCP top electrode is made of Al materials. The bushing is made of Cu materials.
申请公布号 KR20100131307(A) 申请公布日期 2010.12.15
申请号 KR20090050127 申请日期 2009.06.05
申请人 ADAPTIVE PLASMA TECHNOLOGY CORP. 发明人 KIM, NATHAN
分类号 H05H1/26;H01L21/3065 主分类号 H05H1/26
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