发明名称 METHOD OF DRY-ETCHING SILICON NITRIDE FILM
摘要 PROBLEM TO BE SOLVED: To provide a method of dry-etching a silicon nitride film increasing the throughput. SOLUTION: In the method of dry-etching the silicon nitride film 103 for dry-etching the silicon nitride film 103, the silicon nitride film 103 is dry-etched with no generation of plasma by using a process gas at least containing a hydrogen fluoride gas (HF gas) and a fluorine gas (F<SB>2</SB>gas) for an object to be processed 100 with the silicon nitride film 103 formed. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010182730(A) 申请公布日期 2010.08.19
申请号 JP20090022611 申请日期 2009.02.03
申请人 TOKYO ELECTRON LTD 发明人 NISHIMURA EIICHI;SHIMIZU YUSUKE
分类号 H01L21/302;H01L21/3065 主分类号 H01L21/302
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