发明名称 SYSTEM AND METHOD FOR WIRELESSLY TESTING INTEGRATED CIRCUITS
摘要 <p>A system and method for wirelessly testing integrated circuits provides a multiple layer interface to wirelessly test integrated circuits. A wireless testing structure for an integrated circuit comprises a wireless transceiver and a wireless test interface. The wireless transceiver is configured to receive test information from a tester and transmit test result information to the tester. The wireless test interface is configured to interface between the wireless transceiver and the integrated circuit. The wireless test interface comprises a media access controller and a test control block. The media access controller is configured to implement a media access control protocol for wireless communication. The test control block is configured to decode test information received from the tester, to trigger a test of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test.</p>
申请公布号 WO2010031879(A1) 申请公布日期 2010.03.25
申请号 WO2009EP62285 申请日期 2009.09.22
申请人 CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE - CNRS -;ANDREU, DAVID;CAUVET, PHILIPPE;FLOTTES, MARIE-LISE;NOUN, ZIAD;BERNARD, SERGE 发明人 ANDREU, DAVID;CAUVET, PHILIPPE;FLOTTES, MARIE-LISE;NOUN, ZIAD;BERNARD, SERGE
分类号 G01R31/319;G01R31/317 主分类号 G01R31/319
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