发明名称 PIEZOELECTRICAL CHARACTERIZATION OF MATERIALS
摘要 One aspect of the disclosure is a method of characterizing a surface. In an exemplary embodiment, the method includes: (a) positioning a piezoelectric sensor near the surface; (b) obtaining by the sensor a resonant acoustic profile (RAP) of the surface; and (c) analyzing the obtained RAP to characterize the surface. The piezoelectric sensor has an interacting layer, which is adapted for binding to the surface to be characterized. In one embodiment, the characterized surface and the interacting layer are of about the same size.
申请公布号 WO2010007615(A2) 申请公布日期 2010.01.21
申请号 WO2009IL00646 申请日期 2009.06.29
申请人 AMENDIS LTD.;POGOZELICH, GIL;KAPP-BARNEA, YAARA 发明人 POGOZELICH, GIL;KAPP-BARNEA, YAARA
分类号 G01N29/02 主分类号 G01N29/02
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