发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SEMICONDUCTOR MANUFACTURING APPARATUS AND STORAGE MEDIUM
摘要 Provided is a method for performing etching process or film forming process to a substrate W whereupon a prescribed pattern is formed with an opening. The method is provided with a step of mixing a liquid and a gas, at least one of which contains a component that contributes to the etching process or the film forming process, and generating charged nano-bubbles 85 having a diameter smaller than that of the opening formed on the semiconductor substrate W; a step of forming an electric field to attract the nano-bubbles onto the surface of the substrate W; and a step of performing the process by supplying the substrate with the liquid containing the nano-bubbles 85 while forming the electric field.
申请公布号 US2010003807(A1) 申请公布日期 2010.01.07
申请号 US20070522772 申请日期 2007.12.21
申请人 TOKYO ELECTRON LIMITED 发明人 NAGASEKI SUMIE
分类号 H01L21/30;B05B5/025;H01L21/302;H01L21/306 主分类号 H01L21/30
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