发明名称 Positive resist composition and method of pattern formation with the same
摘要 <p>A positive resist composition comprising: (A) a resin which comes to have an enhanced solubility in an alkaline developing solution by an action of an acid; (B) a compound which generates an acid upon irradiation with actinic rays or a radiation; (C) a fluorine-containing compound containing at least one group (z); and (F) a solvent, and a method of pattern formation with the composition: (x) an alkali-soluble group; (y) a group which decomposes by an action of an alkaline developing solution to enhance a solubility in an alkaline developing solution; and (z) a group which decomposes by an action of an acid.</p>
申请公布号 EP2019334(A3) 申请公布日期 2009.07.29
申请号 EP20080165715 申请日期 2006.07.25
申请人 FUJIFILM CORPORATION 发明人 KANDA, HIROMI;KANNA, SHINICHI;INABE, HARUKI
分类号 G03F7/039;G03F7/004 主分类号 G03F7/039
代理机构 代理人
主权项
地址