| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory device capable of improving a test efficiency and a production yield. SOLUTION: The semiconductor memory device is provided with an input command decoder, a command generator, a semiconductor memory, and a write-in determination circuit. First data is written in the semiconductor memory based on second command and first address information from the command generator. The write-in determination circuit compares the first data with the second data read out from the first address and determines whether write-in is performed normally or not. Third command is input further to the input command decoder relieving the first data. When it is determined that write-in is not performed normally, the input command decoder supplies fourth command to which the third command is decoded and the first address information to the command generator. The command generator supplies the second address information being different from the first address, the second command, and the first data to the semiconductor memory based on the fourth command. COPYRIGHT: (C)2007,JPO&INPIT
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