发明名称 Exposure apparatus and device manufacturing method
摘要 A lithographic projection apparatus includes a substrate table configured to hold a substrate, a projection system arranged to project a patterned beam of radiation onto the substrate, a liquid supply system configured to supply liquid to a space between the projection system and the substrate, and a residual liquid detector configured to detect liquid remaining on the substrate and/or the substrate table after an exposure is completed. A device manufacturing method includes projecting, using a projection system of a lithographic apparatus, a patterned beam of radiation through a liquid onto a substrate, the substrate being held by a substrate table, and, after the projecting is complete, detecting residual liquid on the substrate and/or the substrate table.
申请公布号 US2007109517(A1) 申请公布日期 2007.05.17
申请号 US20070651551 申请日期 2007.01.10
申请人 NIKON CORPORATION 发明人 TAKAIWA HIROAKI;HORIUCHI TAKASHI
分类号 G03B27/42;G01B11/00;G01B11/02;G01B11/24;G03F7/20;H01L21/027 主分类号 G03B27/42
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