发明名称 METHOD AND SYSTEM FOR AUTOMATIC DEFECT DETECTION OF ARTICLES IN VISUAL INSPECTION MACHINES [EYEQ]
摘要 There is provided a method for establishing a parameters setup for inspecting a plurality of articles by an automatic inspection system. The method includes inspecting a first article by the inspection system, applying an automatic defects detection method according to a given set of inspection parameters, receiving an initial map of defects and sorting uncovered defects into defect types according to a predetermined set of defect types. While sorting defects, if new defects not recognized by the inspection system are detected, adding the new defects to the initial map to be sorted and automatically setting the inspection parameters by means of applying computational dedicated algorithms, using a heuristic approach, to form a modified parameters setup. The modified parameters setup is then used for obtaining a modified map of detected defects, and the modified parameters setup for inspecting other of the plurality of articles. A system for establishing a parameters setup for inspecting a plurality of articles is also provided.
申请公布号 IL189710(D0) 申请公布日期 2008.06.05
申请号 IL20080189710 申请日期 2008.02.24
申请人 CAMTEK LTD.;ALGRANATI DOTAN;TROPP OREN;KAGAN ROMAN 发明人
分类号 G06T7/00 主分类号 G06T7/00
代理机构 代理人
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