| 摘要 |
A semiconductor component and method of testing a semiconductor component is disclosed. The invention relates to the parallel testing of semiconductor memory components having a fully functional memory area, which are classified as all good memory, and of semiconductor memory components having a restricted memory area, which are classified as partial good memory. For testing semiconductor memory components classified as partial good memory, the result, independently of the result of the comparison for those test addresses which are assigned to a memory area outside the functional memory area of the semiconductor memory component classified as partial good memory, is overwritten with an error free signal and a semiconductor memory component classified as all good memory is simulated. The testing of semiconductor memory components classified as partial good memory is accelerated and simplified.
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