发明名称 METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 <p>A method for fabricating a semiconductor device is provided to form transistors of different structures having various operation characteristics through a simple process. A first gate oxide layer(110) and a first conductive layer are formed on a substrate, and a buffer film is formed to form the first conductive layer in a first region. The first conductive layer and the first gate oxide layer are patterned to form mold film patterns. A gap between the mold film patterns is filled with silicon oxide to form mask patterns. The mold film pattern and the substrate are etched to form a second active region having active pins. The first gate oxide layer, the mask pattern and the buffer film are removed to expose the second active region. A second gate oxide layer(132a) and a second conductive layer are formed on the second active region, and are patterned to form first and second gate electrodes.</p>
申请公布号 KR100739656(B1) 申请公布日期 2007.07.09
申请号 KR20060051408 申请日期 2006.06.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG, SE MYEONG;YOSHIDA MAKOTO;KAHNG, JAE ROK;LEE, CHUL;KIM, KEUN NAM;SUNG, HYUN JU;KIM, HUI JUNG;JUNG, KYOUNG HO
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址
您可能感兴趣的专利