APPARATUS OF MEASURING DEFORMATION OF MICROELEMENT USING SIMILAR TRIANGLES AND METHOD THERE OF,申请号KR20070101780-传众专利搜索

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发明名称	APPARATUS OF MEASURING DEFORMATION OF MICROELEMENT USING SIMILAR TRIANGLES AND METHOD THERE OF
摘要
申请公布号	KR100894819(B1)	申请公布日期	2009.04.24
申请号	KR20070101780	申请日期	2007.10.10
申请人		发明人
分类号	G01B11/02;G01B11/00;G01B11/06	主分类号	G01B11/02
代理机构		代理人
主权项
地址

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