| 摘要 |
A method for testing a memory device is provided to reduce the total test time, by performing the test for other memory cell blocks while the test for one memory cell block is performed. According to a method for testing a memory device comprising a bank consisting of a plurality of memory cell blocks, other memory cell blocks are activated at regular intervals after one of the memory cell blocks is activated. Sensing, read(or write) and precharge operations are performed as to the activated memory cell block among the memory cell blocks.
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