Test board of semiconductor tester having modified I/O printed circuit pattern and method for testing thereof,申请号KR20040078692-传众专利搜索

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发明名称	Test board of semiconductor tester having modified I/O printed circuit pattern and method for testing thereof
摘要
申请公布号	KR100630701(B1)	申请公布日期	2006.10.02
申请号	KR20040078692	申请日期	2004.10.04
申请人		发明人
分类号	G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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