| 摘要 |
PROBLEM TO BE SOLVED: To provide an evaluation method capable of evaluating the quality of test patterns using a failure-activating rate of a completely new concept that positively considers signal lines on activation paths. SOLUTION: The method is to evaluate the quality of the test patterns produced to a logic circuit, and the logic circuit has a plurality of signal lines mutually connected. Wherein an operation step that operates, by an operation means, the number of signal lines operated by specifying failure-extendable signal lines on which a failure effect may be propagated from a predetermined failure location from among a plurality of signal lines, and the number of signal lines on which a failure effect may be propagated from the test patterns. COPYRIGHT: (C)2006,JPO&NCIPI
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