发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE
摘要 <p>A semiconductor device manufacturing method is composed of an element forming plane forming process wherein a plurality of element forming planes (50) having different heights are formed stepwise on a semiconductor layer (1); a semiconductor element forming process wherein semiconductor elements (51, 52) are formed on a region including the element forming planes (50); a step compensation insulating film forming process wherein a step compensation insulating film (28), which covers the semiconductor elements (51, 52) and has a stepwise surface along the element forming planes (50), is formed on the semiconductor layer (1); a peeling layer forming process wherein a peeling layer (31) is formed by ion-implanting a peeling material (30) into the semiconductor layer (1) through the step compensation insulating film (28); and a separating process of separating a part of the semiconductor layer (1) along the peeling layer (31).</p>
申请公布号 WO2006075444(A1) 申请公布日期 2006.07.20
申请号 WO2005JP20945 申请日期 2005.11.15
申请人 SHARP KABUSHIKI KAISHA;FUKUSHIMA, YASUMORI;TAKAFUJI, YUTAKA;MORIGUCHI, MASAO 发明人 FUKUSHIMA, YASUMORI;TAKAFUJI, YUTAKA;MORIGUCHI, MASAO
分类号 H01L21/316;H01L21/02;H01L21/265;H01L21/336;H01L21/762;H01L21/8238;H01L27/08;H01L27/092;H01L27/12;H01L29/786 主分类号 H01L21/316
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