DETECTOR SYSTEM OF SECONDARY AND BACKSCATTERED ELECTRONS FOR A SCANNING ELECTRON MICROSCOPE,申请号EP20040775184-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	DETECTOR SYSTEM OF SECONDARY AND BACKSCATTERED ELECTRONS FOR A SCANNING ELECTRON MICROSCOPE
摘要
申请公布号	EP1673797(A2)	申请公布日期	2006.06.28
申请号	EP20040775184	申请日期	2004.10.06
申请人	POLITECHNIKA WROCLAWSKA	发明人	SLOWKO, WITOLD
分类号	H01J37/244;H01J37/28;(IPC1-7):H01J37/244	主分类号	H01J37/244
代理机构		代理人
主权项
地址

您可能感兴趣的专利

MIXING OF HOMOFILAMENT AND COMPOSITE FILAMENT

PROGRAM SEARCH DEVICE FOR PLURALITY OF TAPE RECORDERS

CHARACTER SHAPING DEVICE

METHOD AND APPARATUS FOR TREATING OPEN WOVEN BASE MATERIAL WITH FOAM

DATA PROCESSING SYSTEM

INPUT DEVICE OF JAPANESE WORD

MAGNETIC RECORDING MEDIUM

METHOD AND DEVICE FOR PRODUCING MULTILAYER PRINTED CIRCUIT BOARD

CONVERSATION TYPE PLOTTER

CONTACTLESS SEAL

METHOD OF RECOVERING SIMULTANEOUSLY ZINC AND MANGANESE DIOXIDE

SINGLE CHANNEL FREQUENCY METER

MEASURING METHOD FOR TEMPERATURE DISTRIBUTION

IPL CONTROLLING SYSTEM OF MULTIVOLUME

INSPECTION METHOD FOR LIQUID LEAKAGE OF BATTERY

COIL DRAWING-OUT METHOD OF COIL BOBBIN

OPTICAL RECORDER AND REPRODUCER