发明名称 On-axis electron impact ion source
摘要 An electron impact ion source includes an ionization chamber in which a first rf multipole field can be generated and an ion guide positioned downstream from the ionization chamber in which a second rf multipole field can be generated wherein electrons are injected into the ionization chamber along the axis (on-axis) to ionize an analyte sample provided to the ionization chamber.
申请公布号 EP1659612(A2) 申请公布日期 2006.05.24
申请号 EP20050023178 申请日期 2005.10.24
申请人 AGILENT TECHNOLOGIES, INC. (A DELAWARE CORPORATION) 发明人 WANG, MINGDA;CIRIMELE, EDWARD C.
分类号 H01J49/14 主分类号 H01J49/14
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