发明名称 APPARATUSES, SYSTEMS AND/OR METHODS TO AFFECT IMPEDANCE
摘要 A method for affecting an impedance of a portion of an electrical circuit loop in an electrical circuit apparatus includes providing an electrical circuit apparatus having at least a portion of an electrical circuit loop including at least one of at least one trace and at least one via, and providing a layer of magnetic material disposed adjacent at least one of the trace and the via. The trace and the via are operatively connected together to provide electrical communication. Dielectric material is disposed in an operative relationship adjacent at least one of the trace and the via. The layer of magnetic material is disposed in operative relationship near at least one of the trace and the via to affect the impedance of at least one of the trace, the via and the portion of the circuit loop formed by the trace and the via.
申请公布号 KR20060045338(A) 申请公布日期 2006.05.17
申请号 KR20050022476 申请日期 2005.03.18
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 TSUK MICHAEL J.
分类号 H05K1/02;H05K1/00;H05K1/03;H05K1/11;(IPC1-7):H05K1111 主分类号 H05K1/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利