发明名称 Halbleitervorrichtung mit Makros und Prüfverfahren dafür
摘要 A semiconductor device includes a common bus (5) and a plurality of macros (1, 2, 3) connected in series by connections (L00, L01,..., L33). Each of the macros is constructed by an internal circuit (11, 12, 13), a buffer (12, 22, 33) connected between an input of the internal circuit and the common bus, a register (13, 23, 33) connected to the common bus, and a logic circuit (14, 24, 34) for selecting one of an output signal of the internal circuit and an output signal of the register. <IMAGE>
申请公布号 DE60026093(D1) 申请公布日期 2006.04.27
申请号 DE2000626093 申请日期 2000.06.05
申请人 NEC ELECTRONICS CORP., KAWASAKI 发明人 OTSUKA, SHIGEKAZU
分类号 G01R31/28;G01R31/3185 主分类号 G01R31/28
代理机构 代理人
主权项
地址