发明名称 Methods of fabricating a semiconductor device using an organic compound and fluoride-based buffered solution
摘要 Methods are provided for fabricating a semiconductor device that include the steps of: sequentially forming a metal interconnection and a protecting layer on a semiconductor substrate; forming a contact hole on the protecting layer; isolating the contact hole by forming a molding layer and an etching stop layer stacked thereon; forming a sacrificial layer on the etching stop layer so as to fill the contact hole; forming a photoresist layer with an opening so as to expose the sacrificial layer and such that the opening of the photoresist layer aligns with the contact hole; forming a trench in the molding layer to penetrate the sacrificial layer and the etching stop layer; and performing a wet etching on the semiconductor substrate having the trench to remove the photoresist layer and the sacrificial layer, wherein the wet etching step is performed using an organic compound and fluoride ion-based buffered solution.
申请公布号 US2005260856(A1) 申请公布日期 2005.11.24
申请号 US20050122881 申请日期 2005.05.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM MI-YOUNG;HAN SANG-CHEOL;KIM TAI-HYOUNG;HWANG JEONG-WOOK;SON HONG-SEONG
分类号 H01L21/306;H01L21/311;H01L21/4763;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/306
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