发明名称 Plasma processing apparatus
摘要 The object of the present invention is to provide a plasma processing apparatus capable of processing a substrate stably for a long period of time. The plasma processing apparatus has a substrate holder disposed in a processing chamber and an electrode cover for protecting a support stage of said substrate holder, for processing a wafer placed on said support stage using a plasma generated in the processing chamber, wherein at least a surface of said electrode cover that is positioned directly below an edge of the wafer, or at least a surface of said electrode cover that comes into contact with plasma, is coated with a material having resistance to plasma and comprising Y<SUB>2</SUB>O<SUB>3</SUB>, Yb<SUB>2</SUB>O<SUB>3 </SUB>or YF<SUB>3</SUB>, or a mixture thereof, as its main component.
申请公布号 US2005193951(A1) 申请公布日期 2005.09.08
申请号 US20040793782 申请日期 2004.03.08
申请人 FURUSE MUNEO;KADOTANI MASANORI;ARAI MASATSUGU;KITADA HIROHO 发明人 FURUSE MUNEO;KADOTANI MASANORI;ARAI MASATSUGU;KITADA HIROHO
分类号 C23C16/00;C23F1/00;(IPC1-7):C23C16/00 主分类号 C23C16/00
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