Device for accurately positioning individual particles on substrate surface, e.g. for quantum computer, has aperture at tip of end portion of cantilever beam

摘要

The device includes a component with at least one aperture for a particle beam directed onto the substrate surface. The component is a cantilever beam supported at one end, and with a free end section (2b). The lower side (2c) of the end section has a tip (4) that comprises the aperture for positioning the particle beam on the substrate surface. The tip may be a hollow cone or hollow pyramid shape, with a hole at the end. Independent claims are included for a scanning device for scanning using atomic force microscope techniques; and for a method of positioning particles on a substrate surface.