发明名称 Semiconductor input protection circuit
摘要 A lateral PNP transistor PB and a lateral NPN transistor NB are serially connected between an input terminal and a reference potential (ground potential). In the transistor PB, a diode D1 is formed. In the transistor NB, a diode D3 is formed. When an ESD of +2000 V is input, the transistor NB turns on, whereas when an ESD of -2000 V is input, the transistor PB turns on. The level of a positive signal capable of being input is limited by the inverse breakdown voltage (e.g., 18 to 50 V) of the diode D3, whereas the level of a negative signal capable of being input is limited by the inverse breakdown voltage (e.g., 13 to 15 V) of the diode D1.
申请公布号 US2005051847(A1) 申请公布日期 2005.03.10
申请号 US20040968685 申请日期 2004.10.19
申请人 YAMAHA CORPORATION. 发明人 TSUJI NOBUAKI;NORO MASAO;MAENO TERUMITSU;HIRADE SEIJI
分类号 H01L27/04;H01L21/822;H01L21/8238;H01L27/02;H01L27/06;H01L27/092;(IPC1-7):H01L29/74 主分类号 H01L27/04
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