发明名称 |
Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device |
摘要 |
A substrate inspection apparatus includes: an electron beam irradiation device which emits an electron beam and causes the electron beam to irradiate a substrate to be inspected as a primary beam; an electron beam detector which detects at least one of a secondary electron, a reflected electron and a backscattered electron that are generated from the substrate that has been irradiated by the electron beam, and which outputs a signal that forms a one-dimensional or two-dimensional image of a surface of the substrate; a mapping projection optical system which causes imaging of at least one of the secondary electron, the reflected electron and the backscattered electron on the electron beam detector as a secondary beam; and an electromagnetic wave irradiation device which generates an electromagnetic wave and causes the electromagnetic wave to irradiate a location on the surface of the substrate at which the secondary beam is generated.
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申请公布号 |
US2005029451(A1) |
申请公布日期 |
2005.02.10 |
申请号 |
US20040853678 |
申请日期 |
2004.05.26 |
申请人 |
NAGAHAMA ICHIROTA;YAMAZAKI YUICHIRO;NAGAI TAKAMITSU;MIYOSHI MOTOSUKE |
发明人 |
NAGAHAMA ICHIROTA;YAMAZAKI YUICHIRO;NAGAI TAKAMITSU;MIYOSHI MOTOSUKE |
分类号 |
H01J37/28;(IPC1-7):G21K7/00;G01N23/00 |
主分类号 |
H01J37/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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