发明名称 HIGH VOLTAGE TRANSISTOR WITH INVERSE DRIFT REGION IN CHANNEL REGION FOR MINIMIZING LEAKAGE CURRENT
摘要 PURPOSE: A high voltage transistor is provided to minimize leakage current of the transistor by forming an inverse drift region in a channel region. CONSTITUTION: A gate insulating layer(106) and a gate electrode(108) are sequentially formed on a well(100) of a substrate. A drift region(102) is formed in the well spaced apart from each other to align the gate electrode. A source/drain region(112) is formed in the drift region. An inverse drift region(104) is formed in the well and between the drift regions.
申请公布号 KR20050012955(A) 申请公布日期 2005.02.02
申请号 KR20030051657 申请日期 2003.07.25
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 KIM, HYUN BYUNG
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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