发明名称 |
HIGH VOLTAGE TRANSISTOR WITH INVERSE DRIFT REGION IN CHANNEL REGION FOR MINIMIZING LEAKAGE CURRENT |
摘要 |
PURPOSE: A high voltage transistor is provided to minimize leakage current of the transistor by forming an inverse drift region in a channel region. CONSTITUTION: A gate insulating layer(106) and a gate electrode(108) are sequentially formed on a well(100) of a substrate. A drift region(102) is formed in the well spaced apart from each other to align the gate electrode. A source/drain region(112) is formed in the drift region. An inverse drift region(104) is formed in the well and between the drift regions.
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申请公布号 |
KR20050012955(A) |
申请公布日期 |
2005.02.02 |
申请号 |
KR20030051657 |
申请日期 |
2003.07.25 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
KIM, HYUN BYUNG |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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