发明名称 Method and device for the contour and/or deformation measurement, particularly the interference measurement, of an object
摘要 The invention serves for the contour measurement and/or deformation measurement of an object, particularly a tire or a structural component of a composite material. The object is irradiated with light, particularly structured light, that is emitted by a radiation source and consists, in particular, of coherent light or partially coherent light, especially laser light. The light reflected by the object is picked up by a camera with an imaging sensor. In order to improve the image quality, a first image is produced with a first adjustment of the camera and/or the radiation source which is adapted to a first image region (13). In addition, a second image is produced with a second adjustment of the camera and/or the radiation source which is adapted to a second image region (12). Both images are combined (FIG. 5).
申请公布号 US2004212795(A1) 申请公布日期 2004.10.28
申请号 US20040833243 申请日期 2004.04.27
申请人 STEINBICHLER OPTOTECHNIK GMBH 发明人 STEINBICHLER HANS;BERGER ROMAN;MAYER THOMAS
分类号 G01B11/16;G01B11/24;G01B11/25;G01M17/02;(IPC1-7):G01B9/02 主分类号 G01B11/16
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