发明名称 |
Plasma processing apparatus and plasma processing method |
摘要 |
A plasma processing method for providing plasma processing to an object to be processed disposed within a vacuum processing chamber in which a process gas feeding device feeds process gas into the vacuum processing chamber, a wafer electrode is placed within the vacuum processing chamber for mounting the object to be processed, a wafer bias power generator applies self-bias voltage to the wafer electrode, and a plasma generator generates plasma within the vacuum processing chamber. The plasma processing method flattens either a positive side voltage or a negative side voltage of a voltage waveform of a high frequency voltage generated to the object at an arbitrary voltage.
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申请公布号 |
US2004045673(A1) |
申请公布日期 |
2004.03.11 |
申请号 |
US20030658398 |
申请日期 |
2003.09.10 |
申请人 |
YASUI NAOKI;SUMIYA MASAHIRO;TAMURA HITOSHI;WATANABE SEIICHI |
发明人 |
YASUI NAOKI;SUMIYA MASAHIRO;TAMURA HITOSHI;WATANABE SEIICHI |
分类号 |
H01J37/32;(IPC1-7):H01L21/306 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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