发明名称 Plasma processing apparatus and plasma processing method
摘要 A plasma processing method for providing plasma processing to an object to be processed disposed within a vacuum processing chamber in which a process gas feeding device feeds process gas into the vacuum processing chamber, a wafer electrode is placed within the vacuum processing chamber for mounting the object to be processed, a wafer bias power generator applies self-bias voltage to the wafer electrode, and a plasma generator generates plasma within the vacuum processing chamber. The plasma processing method flattens either a positive side voltage or a negative side voltage of a voltage waveform of a high frequency voltage generated to the object at an arbitrary voltage.
申请公布号 US2004045673(A1) 申请公布日期 2004.03.11
申请号 US20030658398 申请日期 2003.09.10
申请人 YASUI NAOKI;SUMIYA MASAHIRO;TAMURA HITOSHI;WATANABE SEIICHI 发明人 YASUI NAOKI;SUMIYA MASAHIRO;TAMURA HITOSHI;WATANABE SEIICHI
分类号 H01J37/32;(IPC1-7):H01L21/306 主分类号 H01J37/32
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