发明名称 Hierarchical approach to indentifying changing device characteristics
摘要 Determining device characteristics includes obtaining a first globally accessible value, if the first globally accessible value corresponds to a stored first value, obtaining device characteristics data from a relatively fast memory, if the first globally accessible value does not correspond to the stored first value, obtaining a second globally accessible value, if the second globally accessible value corresponds to a stored second value, obtaining device characteristics data from a relatively fast memory, if the second globally accessible value does not correspond to the stored second value, obtaining device characteristics data from a relatively slow memory and updating the relatively fast memory, the stored first value, and the stored second value. The globally accessible first value may include device I/O information. The globally accessible values may be stored in global memory that is accessible to a plurality of processors.
申请公布号 US6701392(B1) 申请公布日期 2004.03.02
申请号 US20010998494 申请日期 2001.11.30
申请人 EMC CORPORATION 发明人 HALSTEAD MARK J.;OFER ADI;ARNON DAN
分类号 G06F3/06;G06F11/20;G06F12/00;(IPC1-7):G06F3/00 主分类号 G06F3/06
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