发明名称 |
Process and structure to repair damaged probes mounted on a space transformer |
摘要 |
Method for repairing, reworking or replacing damaged probes that are formed using a flying lead wire bonding process used for testing integrated circuit devices and other electronic devices, with the same column and row spacing as the original probes and using the same height as the original probes.
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申请公布号 |
US6523255(B2) |
申请公布日期 |
2003.02.25 |
申请号 |
US20010886960 |
申请日期 |
2001.06.21 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
SHIH DA-YUAN;FOGEL KEITH EDWARD;LAURO PAUL ALFRED;BEAMAN BRIAN SAMUEL |
分类号 |
G01R3/00;(IPC1-7):H05K3/00 |
主分类号 |
G01R3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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