发明名称 |
METHOD FOR FABRICATING CONTACT HOLE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a contact hole of a semiconductor device is provided to control the stress applied to a semiconductor substrate in a subsequent process for etching a self-aligned contact hole by forming a barrier layer on the entire semiconductor substrate in a chamber wherein the volume of the chamber is minimized and SiH2 gas and NH3 gas are mixed in a proper ratio. CONSTITUTION: The barrier layer(120) is formed on the semiconductor substrate(100) having a wordline(110) in a single chamber whose volume is minimized. An interlayer dielectric(130) is stacked on the barrier layer. An exposure and development process are carried out to form a self-aligned contact(140).
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申请公布号 |
KR20030002794(A) |
申请公布日期 |
2003.01.09 |
申请号 |
KR20010038503 |
申请日期 |
2001.06.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HYEONG GYUN;KIM, UI SIK;LEE, MIN YONG;PARK, DONG SU;WOO, SANG HO |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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