发明名称 METHOD FOR FABRICATING CONTACT HOLE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a contact hole of a semiconductor device is provided to control the stress applied to a semiconductor substrate in a subsequent process for etching a self-aligned contact hole by forming a barrier layer on the entire semiconductor substrate in a chamber wherein the volume of the chamber is minimized and SiH2 gas and NH3 gas are mixed in a proper ratio. CONSTITUTION: The barrier layer(120) is formed on the semiconductor substrate(100) having a wordline(110) in a single chamber whose volume is minimized. An interlayer dielectric(130) is stacked on the barrier layer. An exposure and development process are carried out to form a self-aligned contact(140).
申请公布号 KR20030002794(A) 申请公布日期 2003.01.09
申请号 KR20010038503 申请日期 2001.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, HYEONG GYUN;KIM, UI SIK;LEE, MIN YONG;PARK, DONG SU;WOO, SANG HO
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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