发明名称 Apparatus for monitoring speed and operating time of wafer lift of semiconductor fabricating equipment
摘要 An apparatus that automatically monitors speed and operating time of a semiconductor fabricating equipment lift that lifts a wafer cassette up/down. The apparatus automatically indicates operational state of the lift including lift speed time, use time after motor replacement and overhaul, and number of wafers processed, for confirmation by a worker.
申请公布号 US2002186001(A1) 申请公布日期 2002.12.12
申请号 US20020147824 申请日期 2002.05.20
申请人 LEE IN-PYO 发明人 LEE IN-PYO
分类号 H01L21/02;H01L21/00;(IPC1-7):G01R1/00 主分类号 H01L21/02
代理机构 代理人
主权项
地址