发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device, which can deposit a dielectric thin film on a substrate at a practical rate and comprises a process for forming the dielectric thin film having a shallow surface roughness. SOLUTION: When a dielectric thin film is formed on a substrate by a chemical vapor growth method, a method of manufacturing a semiconductor device comprises the process for depositing a part of the dielectric thin film on the substrate, the process for heat-treating this dielectric thin film and moreover, the process for depositing the dielectric thin film at a deposition rate higher than that of the dielectric thin film.
申请公布号 JP2002324793(A) 申请公布日期 2002.11.08
申请号 JP20010127706 申请日期 2001.04.25
申请人 HITACHI LTD 发明人 TSUJIKAWA SHINPEI;MINE TOSHIYUKI;YOSHIGAMI JIRO
分类号 H01L29/78;H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L29/78
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