INFRARED IMAGING OF ULTRASONICALLY EXCITED SUBSURFACE DEFECTS IN MATERIALS
摘要
A thermal imaging system (10) for detecting cracks and defects in a component (12). An ultrasonic transducer (14) is coupled to the specimen (12) through a malleable coupler (16). Ultrasonic energy from the transducer (14) causes the defects to heat up, which is detected by a thermal camera (22). The ultrasonic energy is in the form of a pulse where the frequency of the ultrasonic signal is substantially constant within the pulse. A control unit (30) is employed to provide timing and control for the operation of the ultrasonic transducer (14) and the camera (22).
申请公布号
WO0120319(A9)
申请公布日期
2002.09.26
申请号
WO2000US25373
申请日期
2000.09.15
申请人
WAYNE STATE UNIVERSITY;THOMAS, ROBERT, L.;FAVRO, LAWRENCE, D.;HAN, XIAOYAN;OUYANG, ZHONG;SUI, HUA;SUN, GANG
发明人
THOMAS, ROBERT, L.;FAVRO, LAWRENCE, D.;HAN, XIAOYAN;OUYANG, ZHONG;SUI, HUA;SUN, GANG