| 摘要 |
A method and apparatus for characterizing frequency response of a device (DUT) is disclosed. A repeated base bit pattern is received, the base bit pattern including a first transition from a 0-bit to a 1-bit. Then, using bit error rate distribution, multivalue voltage along the first transition is determined. Finally, the multivalued voltages are converted into frequency domain using fast Fourier transform. The apparatus includes a processor and storage with instructions for the processor to perform these operations. Using the present inventive technique, the frequency response of the DUT can be determined using an error performance analyzer such as a BERT.
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