发明名称 Method and apparatus for solder joint integrity assessment
摘要 The present invention is a method for solder joint integrity assessment. The invention comprises collecting data from one or more solder joint strain tests and characterizing the solder joint data integrity using a force-deflection graph. A force-deflection graph characterizes the response force of a solder joint to applied strain as a function of time. One embodiment of the invention uses the slope of the graph to characterize the integrity of the solder joint. Another embodiment uses the area below the graph to characterize the integrity of the solder joint. To generate the force-deflection graph, the invention applies one or more tests to the solder joint. In one embodiment, a shear test is applied to the solder joint. In another embodiment, a cold pull test is applied to the solder joint. In another embodiment, a hot pull test is applied to the solder joint.
申请公布号 US6371355(B1) 申请公布日期 2002.04.16
申请号 US20000648500 申请日期 2000.08.25
申请人 SUN MICROSYSTEMS, INC. 发明人 NEWMAN KEITH G.
分类号 G01N3/00;G01N3/02;G01N3/24;G01N3/60;(IPC1-7):B23K31/12;B23K5/00;B23K31/00;F27D11/00 主分类号 G01N3/00
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