摘要 |
A semiconductor memory device includes a memory cell capacitor for storing information, wherein the memory cell capacitor includes a capacitor insulation film of a double oxide on a lower electrode. The lower electrode has a layered structure of Ir/IrO2/Ir or Ru/RuO2/Ru acting as a diffusion barrier of oxygen or Pb. Further, the use of a Pt-Ir alloy is disclosed for the lower electrode.
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