发明名称 Semiconductor device having a dielectric film and a fabrication process thereof
摘要 A semiconductor memory device includes a memory cell capacitor for storing information, wherein the memory cell capacitor includes a capacitor insulation film of a double oxide on a lower electrode. The lower electrode has a layered structure of Ir/IrO2/Ir or Ru/RuO2/Ru acting as a diffusion barrier of oxygen or Pb. Further, the use of a Pt-Ir alloy is disclosed for the lower electrode.
申请公布号 US6337238(B1) 申请公布日期 2002.01.08
申请号 US19990256080 申请日期 1999.02.24
申请人 FUJITSU LIMITED 发明人 NAKABAYASHI MASAAKI
分类号 H01L21/8247;H01L21/02;H01L21/768;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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