| 摘要 |
PROBLEM TO BE SOLVED: To provide a system and a method for producing a test pattern, enabling defects in a mounting stage detectable previously during manufacturing test, etc. SOLUTION: With respect to the terminal signal of a semiconductor device, a logic analyzer acquires signal waveform data for a period including defect- existing time, standing from the time in the past earlier that the time of defect occurrence. The test pattern producing system converts the waveform data into a test pattern and outputs it to an automatic test device for testing the semiconductor device as a tested device. Data for the defect-existing time is changed into normal data to prepare an expected value pattern relative to an output signal of the semiconductor device. It is checked as to whether the setting of a required input signal corresponding to the output signal exists in the signal waveform data. If it does not exist, a test pattern is produced for setting the input signal into the semiconductor device. When the defect is reproduced by the test device, the test pattern is used for mass production test. |
