发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE OF THE SAME
摘要 PURPOSE: To enable a semiconductor device which is equipped with a gate electrode of multilayered structure to be improved in reliability. CONSTITUTION: A gate electrode 7 is equipped with a polycrystalline silicon layer 3, a barrier layer 4, and a metal layer 5. For instance, the metal layer 5 is formed of W, and the barrier layer 4 is formed of RuO2. When the gate electrode 7 is formed, the metal layer 5 and the barrier 4 are etched, using at least either the barrier layer 4 or the polycrystalline silicon layer 3 as an etching stopper.
申请公布号 KR20010014954(A) 申请公布日期 2001.02.26
申请号 KR20000027253 申请日期 2000.05.20
申请人 MITSUBISHI ELECTRIC CORP 发明人 FUJIWARA NOBUO;MARUYAMA TAKAHIRO;SAKAMORI SHIGENORI;TERATANI AKIYOSHI;OGINO MASARU;OMI KAZUYUKI;IRIE YUZO
分类号 H01L21/302;H01L21/28;H01L21/3065;H01L21/3213;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L21/321 主分类号 H01L21/302
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