发明名称 |
MAINTENANCE APPARATUS FOR TESTING ELECTRONIC COMPONENTS |
摘要 |
PURPOSE: A maintenance apparatus for testing an electronic component is provided to prevent a bad contact and damage of a terminal by uniformalizing pressure under a condition of maintaining an electronic component compressed to a contact part of a test head. CONSTITUTION: A terminal of an electronic component is tested in the state of being compressed to a contact part(302a) of a test head. A pusher base(304c1) is installed enabling approach and separation from the contact part(302a). A moving base(304c3) installed for moving to the pusher base(304c1), has a maintenance pad(304c2) for maintaining the electronic component. A fluid pressure cylinder(304c4) installed at side of the pusher base(304c1), presses the moving base against the contact part(302a).
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申请公布号 |
KR20000029353(A) |
申请公布日期 |
2000.05.25 |
申请号 |
KR19990046841 |
申请日期 |
1999.10.27 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
YAMASHITA KAZYUKI;NAKAMURA HIROTO |
分类号 |
G01R31/26;G01R31/00;G01R31/02;H01L21/66;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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