发明名称 MAINTENANCE APPARATUS FOR TESTING ELECTRONIC COMPONENTS
摘要 PURPOSE: A maintenance apparatus for testing an electronic component is provided to prevent a bad contact and damage of a terminal by uniformalizing pressure under a condition of maintaining an electronic component compressed to a contact part of a test head. CONSTITUTION: A terminal of an electronic component is tested in the state of being compressed to a contact part(302a) of a test head. A pusher base(304c1) is installed enabling approach and separation from the contact part(302a). A moving base(304c3) installed for moving to the pusher base(304c1), has a maintenance pad(304c2) for maintaining the electronic component. A fluid pressure cylinder(304c4) installed at side of the pusher base(304c1), presses the moving base against the contact part(302a).
申请公布号 KR20000029353(A) 申请公布日期 2000.05.25
申请号 KR19990046841 申请日期 1999.10.27
申请人 ADVANTEST CORPORATION 发明人 YAMASHITA KAZYUKI;NAKAMURA HIROTO
分类号 G01R31/26;G01R31/00;G01R31/02;H01L21/66;(IPC1-7):G01R31/26 主分类号 G01R31/26
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