| 摘要 |
PROBLEM TO BE SOLVED: To provide semiconductor test device/method for conducting the operation/voltage precision test of a DA converter and the combination test of all output voltages in short time with the minimum number of comparators without raising the cost of an inspection device. SOLUTION: Prescribed voltage is applied to the upper limit reference power and the lower limit reference power of a DA converter 7 in accordance with the change of a test pattern so that output voltage at normal time, which corresponds to the inputted test pattern, becomes that between the upper limit and the lower of comparators 10a and 10b in the testing method of a semiconductor integrated circuit having the DA converter. The output voltage of the DA converter is judged by comparators 10a and 10b.
|
