发明名称 FLUORESCENT X-RAY SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To enable correct alignment by storing an image pickup apparatus and an image display apparatus in the same case and changing a relative position of the case and a sample while observing a sample image of the display apparatus. SOLUTION: A fluorescent X ray generated from a sample 3 to be measured is detected by an X-ray detector 4 stored in a casing 10, converted to an electric signal, electrically processed by a detecting circuit system 5 and formed to an X-ray spectrum expressed by an intensity to an energy. An image of the sample 3 is obtained by an image pickup device 7 in the casing 10, synthesized with the X-ray spectrum generated at the detecting circuit system 5 at an image synthesizer 6 electrically connected to the image pickup device 7, and then displayed on a display device 9 mounted on the casing 10. The casing 10 or sample 3 is moved to make a desired analysis point of the sample 3 displayed on the display device 9, so that the desired analysis point can be measured.
申请公布号 JP2000046763(A) 申请公布日期 2000.02.18
申请号 JP19980208261 申请日期 1998.07.23
申请人 SEIKO INSTRUMENTS INC 发明人 TAMURA KOICHI
分类号 G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/223
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