发明名称 Semiconductor integrated circuit device and a manufacturing method thereof
摘要 A semiconductor integrated circuit device having a DRAM consisting of memory cells, comprises; a first conductive film deposited over the main surface of a semiconductor substrate and used to form a gate electrode of a memory cell selection MISFET; a second conductive film deposited over the first conductive film and used to form bit lines to transfer data of a memory cell to a sense amplifier; a third conductive film deposited over the second conductive film and used to form a storage node of a capacitor; a fourth conductive film deposited over the third conductive film and used to form a plate electrode of the capacitor; and a fifth conductive film deposited over the fourth conductive film and used to form an interconnect, wherein a transistor in a direct peripheral circuit arranged close to a memory array is electrically connected, through a pad layer formed of the third conductive film, to the interconnection of the fifth conductive film deposited over the fourth conductive film, thereby allowing the aspect ratio of the contact hole formed over the pad layer to be reduced.
申请公布号 US5604365(A) 申请公布日期 1997.02.18
申请号 US19940297039 申请日期 1994.08.29
申请人 HITACHI, LTD. 发明人 KAJIGAYA, KAZUHIKO;NAKAMURA, MASAYUKI;TACHIBANA, TOSHIKAZU
分类号 H01L27/105;H01L27/108;(IPC1-7):H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L27/105
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