发明名称 PROBE FOR ANALYSIS OF METALLIC SAMPLE
摘要 PURPOSE: To provide a probe for analysis of metallic samples which can easily analyze a sample to be dissolved without breaking the same and obtain a sample solution quickly thereby shortening an analyzing time. CONSTITUTION: The electrolyzation is conducted with using a metallic sample 1 as arm anode. Elements in the metallic sample 1 are dissolved in an electrolytic solution A in an electrolyzation chamber 2 thereby to obtain a sample solution B. The sample solution B is sent to an ICP emission analyzer 3. The probe has a feed port 4 for supplying the electrolytic solution A, a discharge port 5 for sending the sample solution B from the electrolyzation chamber 2 to the ICP emission analyzer 3, a hollow cylindrical cathode part 6 of graphite to which an electrolyzation voltage is impressed via the metallic sample 1 so as to generate an electrolyzation current, a cylindrical non-conductive sheath 7 covering the whole periphery of the cathode part 6, and an opening part 9 kept in sealed touch with a surface 1a of the metallic sample by a sealing material 8 thereby forming the electrolyzation chamber 2 between the surface 1a and the cathode part 6.
申请公布号 JPH08145860(A) 申请公布日期 1996.06.07
申请号 JP19940309788 申请日期 1994.11.19
申请人 HORIBA LTD 发明人 UEMURA TAKESHI;MATSUDA KOICHIRO
分类号 G01N23/22;G01N1/28;G01N30/06 主分类号 G01N23/22
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