发明名称 Thermal measuring and testing system having synchronized sample transporting means
摘要 A thermal analysis device with a sample transporting machine which automatically carries out pretreatment of a sample to quickly heat or cool it. The configuration includes an electric furnace, a temperature controller, a temperature program setter, a sample placing/removing program setter, and a sample transporter, wherein the said sample placing/removing program setter commands the said sample transporter to place the said sample in or remove it from the said electric furnace in synchronization with a synchronization signal from the said temperature program setter and in accordance with a preset sample placing/removing program and, hence, the said sample placing and removing operations (i.e. to place a sample in the electric furnace or, conversely to remove a sample from the electric furnace) are carried out in the electric furnace which is performing a heating operation or a cooling operation in accordance with a temperature program output by the said temperature program setter.
申请公布号 US5293404(A) 申请公布日期 1994.03.08
申请号 US19910799060 申请日期 1991.11.27
申请人 SEIKO INSTRUMENTS INC. 发明人 TAKEDA, HARUO
分类号 G01N25/00;B01L7/00;F27B17/02;F27D19/00;G01N1/00;G01N25/48;G05D23/19;(IPC1-7):H05B1/02 主分类号 G01N25/00
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