| 摘要 |
PURPOSE:To provide a computing element testing circuit and its testing method capable of easily forming a test pattern and quickly executing evaluation. CONSTITUTION:A computing element is tested by a test of an adder 20 for executing evaluation by the addition of two different values having a difference of '1' and the input operation of a carry a test for generating its own test signal from a circuit to be tested, a test for repeating the same input in each two unit adders and attaining evaluation by 16 patterns, and a test for constituting an LFSR by combining an exOR circuit to be a part of the tested circuit and an input holding means. |
